Jual Epsilon 5 | XRF Instrument

Leading the way in heavy metals analysis

A fully integrated X-ray fluorescence (XRF) spectrometer, the Epsilon 5 combines advanced elemental excitation capabilities with sophisticated instrument control and analytical software.

Epsilon 5 provides high-performance trace element analysis for industry, research and development applications, as well as being a cost-effective option for commercial analytical laboratories.

A unique and patented EDXRF system design

Epsilon 5 is a unique high-resolution energy dispersive X-ray fluorescence spectrometer specifically designed to deliver enhanced sensitivity and accuracy with significantly reduced backgrounds. A combination of optimized Cartesian-geometrical design for lower backgrounds and extended K line excitation 100 kV X-ray capability technology, make the Epsilon 5 a powerful instrument. The result is superior and often shows sub-ppm detection limits for mid to heavy elements (Fe – U).

Improved trace-level quantification of heavy elements

Epsilon 5 excels when measuring medium to heavy elements. This is largely due to an enhanced X-ray excitation design. By definition the K-line of any element is the optimal spectral line to measure because of its superior sensitivity and reduced spectral interference. Combining high excitation voltages, up to 100 kV, with a matching 100% efficient Ge solid-state detector, the
Epsilon 5 extends the range of K-line excitation throughout the heavy elements, including the rare earth elements.

Use of K-series lines for heavy elements

Traditionally in XRF, heavy elements are analyzed using their L-series spectral lines. This is because of restrictions imposed on using K-lines by inadequate excitation voltages, sub-optimal detector efficiency and, in the case of WDXRF, poorer dispersion. However, the main problem with using L-lines is that they lie in crowded parts of the spectrum, commonly overlapped by lines of major elements. They also have relatively low sensitivities. A comparison with typical WDXRF systems reveals the Epsilon 5 has superior performance for elements ranging from molybdenum to the rare earth elements.

Non-destructive analysis

The Epsilon 5 exhibits very low sample heating or X-ray damage due to a combination of low power and polarized (Cartesian geometry) optics. The absence of sample heating means that delicate organic samples, foils and filters can be measured repeatedly without inflicting any damage.